Physical Principles of Electron Microscopy, 2nd Edition

Physical Principles of Electron Microscopy, 2nd Edition Front Cover
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181 pages

Book Description

Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and sciences. This book introduces current and practice of electron microscopy, primarily for undergraduates who need to understand how the of apply in an area of that has contributed greatly to our understanding of life processes and "inner space." Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.

Table of Contents

Chapter 1 An Introduction to Microscopy
Chapter 2 Electron Optics
Chapter 3 The Transmission Electron Microscope
Chapter 4 TEM Specimens and Images
Chapter 5 The Scanning Electron Microscope
Chapter 6 Analytical Electron Microscopy
Chapter 7 Special Topics
Appendix: Mathematical Derivations

Book Details

  • Title: Physical Principles of Electron Microscopy, 2nd Edition
  • Author:
  • Length: 181 pages
  • Edition: 2nd ed. 2016
  • Language: English
  • Publisher:
  • Publication Date: 2016-08-02
  • ISBN-10: 3319398768
  • ISBN-13: 9783319398761
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